This volume contains papers presented at The 15th International Conference on the Texture of Materials from June 1-5th, 2008 in Pittsburgh, PA. Chapters include: * Thin Films * Texture at Non-Ambient Conditions * Novel Texture Measurement Techniques Including 3D * Complex Oxides * Interface Textures * Recrystallization Texture * Biomaterials * Texture Effects on Damage Accumulation * Digital Microstructures View information on href="http://www.wiley.com/remtitle.cgi?isbn=0470408340">Materials Processing and Texture: Ceramic Transactions, Volume 200.



Autorentext

A.D. Rollett obtained an M.A. in Metallurgy and Materials Science from Cambridge University, England in 1977 and a Ph.D. in Materials Engineering from Drexel University in 1987. He worked for the Los Alamos National Laboratory for sixteen years, rising to be the Deputy Director of the Materials Science & Technology Division in 1994. He then moved to Carnegie Mellon University to be the Department Head in Materials Science & Engineering until 2000. He is active in the Materials Research Science & Engineering Center at CMU and is the Focal Area Point of Contact for Computational Chemistry & Materials for the DoD.



Inhalt

Preface xv

Acknowledgments xvii

THIN FILMS (MICROELECTRONICS, HTSC)

The Texture of Thin Nisi Films and Its Effect on Agglomeration 3
K. De Keyser, C. Detavernier , R. L. Van Meirhaeghe, J. Jordan-Sweet, and C. Lavoie

Epitaxial Substrates from Ni-Based Ternary Alloys With Cr and W 11
D.P. Rodionov, I.V. Gervasyeva, Yu.V. Khlebnikova, and V.A. Kazantsev

Cube Texture Formation in Ni-Pd and Ni-Pd-W Alloys For HTS Tapes 23
I.V. Gervasyeva, D.P. Rodionov, Yu.V. Khlebnikova, G.A. Dosovitskii, and A.R. Kaul

Texture of Rapidly Solidified Cu Thin Films Studied by SEM EBSD and TEM 35
R. Zhong, A. Kulovits, J.M.K. Wiezorek, and J.P. Leonard

Control of Texture in Polycrystalline Thin Films Used as Data Storage Media 47
David E. Laughlin, Hua Yuan, En Yang, and Chun Wang

Influences of Processing Parameters on Microstructures and Microtextures of Au Flip Chip Bonds During Microelectronics Packaging 57
P Yang, C-M Li, D-M Liu, M Hung, M Li, and W-M Mao

TEXTURE AT NON-AMBIENT CONDITIONS

In Situ Observation of Texture Evolution in Ti-10-2-3 65
Seerna L. Raghunathan, Richard Dashwood, Martin Jackson, Sven Vogel, and David Dye

Study of Texture Evolution at High Strain Rates in FCC Materials 73
Nilesh Gurao, Satyam Suwas, and Rajeev Kapoor

Texture and Microstructure Development in Copper after Cryogenic Rolling and Heat Treatment 83
A. Haldar, D. Das, and P.P. Chattopadhyay

In-Situ EBSD Study of the a-y-a Phase Transformation in a Microalloyed Steel 95
Lischewski, D. M. Kirch, A. Ziemons, and G. Gottstein

Texture Changes during Phase Transformations Studied In Situ With Neutron Diffraction 103
Hans-Rudolf Wenk

NOVEL TEXTURE MEASUREMENT TECHNIQUES INCLUDING 3D

Three-Dimensional FIB-OIM of Ceramic Materials 117
Shen J. Dillon and Gregory S. Rohrer

Comparison of X-Ray and EBSD Textures for Back-Annealed AI-Mg Alloys 125
0. Engler

A New Method for Quantification of Texture Uniformity of Plate 135
Peter Jepson and Robert Bailey

Separating Coincident Electron Backscatter Diffraction Patterns Near Interfaces 147
Josh Kacher, Brent L. Adarns, David Fullwood, and Colin Landon

Rapid Texture Determination Based on Two Dimensional X Ray Detector 155
Weimin Mao

Semiautomatic Determination of Orientations and Elastic Strain from Kossel Microdiffraction 163
Adam Morawiec, Raphael Pesci, and Jean-Sebastien Lecomte

Statistically Reliable EBSD Analysis Method of Grain Boundary Characterization 171
D.H. Kim, J.Y.Kang, D.I. Kim, E.K. Her, S.J. Kim, H.N. Han, K.H. Oh, and H.C. Lee

3D Microstructures and Textures of a Plane Strain Compressed (1 10}4 12> AI-0.3% Mn Single Crystal 181
H. Paul, J.H. Driver, and CI. Maurice

Three Laws of Substructure Anisotropy of Textured Metal Materials, Revealed by X-Ray Method of Generalized Pole Figures 189
Yuriy Perlovich, Margarita Isaenkova, and Vladimir Fesenko

3D-Microstructural and Texture Characterization in Different Length Scales 197
Roumen Petrov and Patricia Gobernado Hernandez, Orlando Leon Garcia, Hemant Sharma, and Leo Kestens

Local Crystal Rotations of Bulk Grains by High-Resolution EBSD during Hot PSC of AI-0.1 % Mn Polycrystals 205
Romain Quey, David Piot, and Julian Driver

Grain Boundary Orientations in a Fe-Mn-Cu Polycrystalline Alloy 213
M. Takashima and P. Wynblatt

Development of a TEM-Based Orientation Microscopy System 221
S. Zaefferer and G. Wu

COMPLEX OXIDES AND OTHER COMPOUNDS

Domain Control Effect on Voltage-Strain in BaTi03 Single Crystal 231
Yoshio Akimune, Kazuo Matsuo, Ryutaro Oishi, and Akira Okada

Tentative Simulation of Crystal Rotation for N...

Titel
Applications of Texture Analysis
Untertitel
Ceramic Transactions
EAN
9780470444207
ISBN
978-0-470-44420-7
Format
E-Book (pdf)
Veröffentlichung
05.12.2008
Digitaler Kopierschutz
Adobe-DRM
Dateigrösse
46.56 MB
Anzahl Seiten
836
Jahr
2008
Untertitel
Englisch