This exciting new handbook investigates the characterization of surfaces. It emphasizes experimental techniques for imaging of solid surfaces and theoretical strategies for visualization of surfaces, areas in which rapid progress is currently being made. This comprehensive, unique volume is the ideal reference for researchers needing quick access to the latest developments in the field and an excellent introduction to students who want to acquaint themselves with the behavior of electrons, atoms, molecules, and thin-films at surfaces. It's all here, under one cover! The Handbook of Surface Imaging and Visualization is filled with sixty-four of the most powerful techniques for characterization of surfaces and interfaces in the material sciences, medicine, biology, geology, chemistry, and physics. Each discussion is easy to understand, succinct, yet incredibly informative. Data illustrate present research in each area of study. A wide variety of the latest experimental and theoretical approaches are included with both practical and fundamental objectives in mind. Key references are included for the reader's convenience for locating the most recent and useful work on each topic. Readers are encouraged to contact the authors or consult the references for additional information. This is the best ready reference available today. It is a perfect source book or supplemental text on the subject.

Arthur T. Hubbard

ANGLE RESOLVED AUGER ELECTRON SPECTROSCOPY, D.G. Frank, Introduction, Auger Electron Emission from Solid Surfaces, The Auger Phenomenon, Angle-Resolved Auger Electron Measurements, Experimental Considerations, Auger Electron KE and the "Secant Effect", Incident Radiation, Angle-Resolving Analyzers, Auger Signal Detection, Data Visualization, Theoretical Approaches, Basic Principles, Empirical Trends, Empirical Blocking Model, Inelastic Scattering, Elastic Scattering, Example Applications, Depth Profiling, Monolayer Structure, Bilayer Structure, Single Crystals, Layered Crystals, Acknowledgements, References, Atomic Force Microscopy, A.A. Gewirth and J.R. LaGraff, Introduction, General Principles, AFM Operation, Tip-Sample Interaction, Representative Results, Electrochemistry, Biological Systems, Self-Assembled Langmuir-Blodgett Films, Crystal Dissolution and Growth, Future Prospects, Acknowledgement, References, Auger Electron Spectroscopy, N.H. Turner, Introduction, Basics, Elemental Identification, Surface Sensitivity, Overview of Spectral Features, Instrumentation, Vacuum Systems, Electron Sources, Energy Analyzers, Other Accessories, Spectral Features, Main Spectral Features, Charging, Quantification, Summary, References, Chemical Imaging Using Ion Microscopy, I. Gay and G.H. Morrison, Introduction, Instrumentation, Detection and Image Acquisition Systems, Quantification, Applications of Ion Microscopy, Materials Science and Geology, Biology and Medicine, Conclusions, Acknowledgements, References, Collision Induced Surface Processes, S.T. Ceyer, Introduction, Examples of Collision Induced Surface Processes, Translational Activation, Collision Induced Activation, Collision Induced Desorption, Collision Induced Absorption, Collision Induced Recombinative Desorption, Signficance of Collision Induced Surface Processes, References, Depth Profiling, G.B. Hoflund, Introduction, The Ion Sputtering Process, Pure Materials, Multicomponent Solids, References, Electrochemical Epitaxy, H.M. Baoming, T.E. Lister, and J.L. Stickney, Introduction, Experimental, Electrochemical Atomic Layer Epitaxy, Acknowledgements, References, Electrochemical Nucleation, R. de Levie, The Energetics of Nucleation, The Thermodynamics of Nucleated Monolayer Films, The Kinetics of Nucleation, Growth, Overlap, Experimental Observations, Metal Deposition, The Formation of Salt Layers, Condensation of Adsorbate Films, Relevance for Studies at the Metal-Vacuum Interface, General References, Electrochemical Quartz Crystal Microbalance Studies of Electroactive Surface Films, S. Bruckenstein and R. Hillman, Principles of the Quartz Crystal Microbalance, In situ Application: The Electrochemical Quartz Crystal Microbalance, Chemical Principles, Chemical Systems, Polymer Films, Metal Oxide Films, Other Systems, Future Prospects, Absolute Measurement of Solvent Content, Crystal Impedance Modeling, Surface Morphology, Summary, References, Electron Beam Lithography, F.J. Hohn, Introduction, Classes of Electron Beam Lithography Tools, Gaussian Round Beam Systems, Variable Shape Beam Systems, Performance Limitations, Resolution, Accuracy, Electron Beam Lithography-Integration Considerations, Proximity Effect, Electron Beam Lithography Applications, Application Emphasis, Application for Nano-Devices, Summary, References, Electron Microscopy, J.M. Cowley, Introduction, The Scattering of High Energy Electrons by Matter, Instruments for Electron Microscopy, Use of Electron Microscopes for Surface Studies, Transmission Electron Microscopy, Plan-View Diffraction and Imaging, Profile Imaging, Transmission Electron Holography, Reflection Electron Microscopy (REM), RHEED and REM, Contrast and Resolution in REM, Scanning Reflection Electron Microscopy, Reflection Electron Energy-Loss Analysis, Reflection Electron Holography, Imaging with Secondary Radiation, Secondary Electron Microscopy, Scanning Auger Microscopy, X-Ray Emission, Special Topics, UHV Instruments, Very Low Voltage Electron Holography, Conclusions, References, Electron Stimulated Desorption-Ion Angular Distribution (ESDIAD), J.T. Yates, Jr., Introduction, The ESDIAD Phenomenon, The ESDIAD Measurement Technique, Selected Examples of ESDIAD Measurements on Metal and Semiconductor Surfaces, Chemisorption on a Metal Surface, Chemisorption on a Semiconductor Surface, Future Directions, Acknowledgements, References, Field Emission Ion Sources for Focused Ion Beams, J. Orloff, Introduction, Field Emission Process, Field Ionization, Field Evaporation, Liquid Metal Ion Sources, Properties of Field Emission Ion Sources, Gas Phase Field Ionization Sources, Liquid Metal Ion Sources, Implications for Focused Ion Beam Formation, References, Field Emission Microscopy, J.J. Hren and J. Liu, Surface Electron Microscopies, Field Electron Emission, Field Emission Microscopy, Field Emission from Crystals, The Theoretical Resolution of FEM, Practical FEM, The FEM of Absorbed Molecules, Combining Field Emission and Field Ion Microscopy, References, Field-Ion Microscopy and Spectroscopy, G. Ehrlich and N. Ernst, Historical Introduction, The Field Ion Microscope, Selected Applications, FIM Variants, The Atom Probe, Field Ion Appearance Energy Spectroscopy, Summary, Acknowledgements, References, Fluid-Fluid Interfaces: Optical Imaging of Capillary Systems, A.D. Nikolov and D.T. Wasan, Introduction, Imaging a Profile of a Fluid by Light Interference Phenomena, Reflection Interferometry, Differential Interferometry, Film Thickness Interferometry, Imaging the Film Structure by Using Diffractive Scattering Phenomena, Imaging Film Structure by Small Angle Diffraction, Imaging Film Structure by Background Light Scattering Diffraction, Imaging Film Structure by Light Scattering, Acknowledgements, References, Fullerenes Viewed by Scanning Tunneling Microscopy, Photoemission, and Inverse Photoemission, J.H. Weaver, Introduction, STM of Fullerene Films, Electron Spectroscopy of Fullerenes, C60 Valence and Conduction Bands, C84 and Graphite Valence Bands, C 1s Satellites and Plasmons for C60, C84, and Graphite, Summary, Acknowledgements, References, High Resolution Electron Energy Loss Spectroscopy, L.L. Kesmodel, Introduction, Experimental Apparatus, Theory, Dipole Scattering, Impact Scattering, Resonance Scattering, Examples, Applications, Supported Catalysts (Metal Clusters), Characterization of Insulators for Silicon Technology, Polar Materials: Oxides, Polymer Surfaces, References, Imaging of…