In an increasingly uncertain world, the pace of change is swift and quickening. Risk management is more important than ever before, and adaptability is key. Not every negative event can be mitigated, but the right approaches will allow a company to respond effectively and even to thrive in crisis situations. This approachable book features the advice of expert practitioner and academic authors, benefiting companies whatever their culture and operating environment. Worked examples and case studies span the operational aspects of risk management, reputation risk, and risks outside the control of any organization, forming a comprehensive guide. Detailed coverage includes: * Risk, metrics, and complexity * Countering supply chain risk * Business continuity management * Reputation risk and financial performance * Moving beyond compliance * Integrating catastrophe management * Human risk and rogues * Strategic risk management * Crisis management strategies * Exposure to country, political, and interest rate risks

Editor Bill Sharon has been conducting seminars, workshops, and consulting assignments in the area of risk management for the past 14 years. He has 30 years' experience in the financial services and marketing/communications industry in a variety of C-level positions and consultancies. He has been featured in numerous industry magazines (Intelligent Risk, CIO Magazine, Business Finance, and Business Credit Magazine) and has authored numerous articles. Bill holds a clinical degree, and for the first 10 years of his professional life he worked with adolescents-an experience that taught him the very difficult skill of how to listen. His website, Strategic Operational Risk Management Solutions, can be found at sorms.com.

Other contributors include: Mark Abkowitz, Ian Bremmer, Magnus Carter, Aswath Damodaran, Graham Dawson, Daniel Diermeier, Andrew Hiles, Tim Johnson, Vinod Lall, John L. Mariotti, Duncan Martin, Thomas McKaig, Jenny Rayner, Jonathan Silberstein-Loeb, Will Spinney, Juergen Bernd Weiss, and Jon White.