Illustrating their intersecting role in manufacturing and technological development, this book examines tribological principles and their applications in CMP, including integrated circuits, basic concepts in surfaces of contacts, and common defects as well as friction, lubrication fundamentals, and the basics of wear. The book concludes its focus with mechanical aspects of CMP, pad materials, elastic modulus, and cell buckling. As the first source to integrate CMP and tribology, Tribology in Chemical-Mechanical Planarization provides applied scientists and engineers in the fields of semiconductors and microelectronics with clear foresight to the future of this technology.



Zusammenfassung
The role that friction and contact play in the processes of wear and planarization on material surfaces is central to the understanding of Chemical-Mechanical planarization (CMP) technology, particularly when applied to nanosurfaces. Tribology in Chemical-Mechanical Planarization presents a detailed account of the CMP process in a language that is

Inhalt

Introduction, Surface Properties, Friction, Lubrication, Wear In CMP, Force Transmission, CMP Pads, Post-CMP Cleaning

Titel
Tribology In Chemical-Mechanical Planarization
EAN
9781420028393
ISBN
978-1-4200-2839-3
Format
E-Book (pdf)
Herausgeber
Veröffentlichung
01.03.2005
Digitaler Kopierschutz
Adobe-DRM
Dateigrösse
9.22 MB
Anzahl Seiten
200
Jahr
2005
Untertitel
Englisch