This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.



Autorentext

Sebastian, M. T.; Krishna, P.



Inhalt

1 Introduction, 2 Stacking faults in dose-packed structures, 3 Diffuse X-ray scattering from randomly faulted close-packed structures, 4 Phase-transformations and non-random faulting in dose-packed structures, 5 Periodic Faulting in Crystals: Polytypism

Titel
Random Non-Random Periodic Fau
EAN
9781351552370
ISBN
978-1-351-55237-0
Format
E-Book (pdf)
Herausgeber
Veröffentlichung
05.07.2017
Digitaler Kopierschutz
Adobe-DRM
Dateigrösse
20.68 MB
Anzahl Seiten
400
Jahr
2017
Untertitel
Englisch