A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems
The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings.
The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies.
* Contains a well-organized reference that provides a quick review on a range of ESD topics
* Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications
* Offers information in clear and accessible terms
* Written by the accomplished author of the popular ESD book series
Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.
Autorentext
Steven H. Voldman is the first IEEE Fellow for contributions in ESD protection in CMOS, SOI, and Silicon Germanium technology. He has been at the forefront of every major development in semiconductor technology over the past thirty years.
Inhalt
About the Author xxxvii
Acknowledgements xxxix
1 ESD, EOS, EMI, EMC, and Latchup 1
1.1 Electrostatic Discharge (ESD) 1
1.2 Human Body Model (HBM) 2
1.3 Machine Model (MM) 3
1.4 Cassette Model 3
1.5 Charged Device Model (CDM) 4
1.6 Transmission Line Pulse (TLP) 5
1.7 Very Fast Transmission Line Pulse (VF-TLP) 8
1.8 Electrical Overstress (EOS) 8
1.9 Electrical Overstress (EOS) 8
1.10 EOS Sources Lightning 9
1.11 EOS Sources Electromagnetic Pulse (EMP) 9
1.12 EOS Sources Machinery 10
1.13 EOS Sources Power Distribution 10
1.14 EOS Sources Switches, Relays, and Coils 10
1.15 EOS Design Flow and Product Definition 10
1.16 EOS Sources Design Issues 11
1.17 Electromagnetic Interference (EMI) 12
1.18 Electromagnetic Compatibility (EMC) 13
1.19 Latchup 13
Questions and Answers 14
1.20 Summary and Closing Comments 15
References 15
2 ESD in Manufacturing 21
2.1 Flooring 21
2.2 Work Surfaces 21
2.3 Garments 22
2.4 Wrist Straps 22
2.5 Shoes Footwear 22
2.6 Ionization 23
2.7 Clean Rooms 24
2.8 Carts 26
2.9 Shipping Tubes 26
2.10 Trays 27
2.11 Measurements 27
2.12 Verification 28
2.13 Audit 28
2.14 Triboelectric Charging How Does it Happen? 29
2.15 Conductors, Semiconductors, and Insulators 30
2.16 Static Dissipative Materials 30
2.17 ESD and Materials 31
2.18 Electrification and Coulomb's Law 31
2.19 Electromagnetism and Electrodynamics 33
2.20 Electrical Breakdown 33
2.21 Electro-Quasistatics and Magnetoquasistatics 36
2.22 Electrodynamics and Maxwell's Equations 36
2.23 Electrostatic Discharge (ESD) 36
2.24 Electromagnetic Compatibility (EMC) 37
2.25 Electromagnetic Interference (EMI) 37
2.26 Fundamentals of Manufacturing and Electrostatics 37
2.27 Materials, Tooling, Human Factors, and Electrostatic Discharge 38
2.28 Materials and Human-induced Electric Fields 39
2.29 Manufacturing Environment and Tooling 39
2.30 Manufacturing Equipment and ESD Manufacturing Problems 39
2.31 Manufacturing Materials 39
2.32 Measurement and Test Equipment 40
2.33 Manufacturing Testing for Compliance 41
2.34 Grounding and Bonding Systems 42
2.35 Work Surfaces 42
2.36 Wrist Straps 43
2.37 Constant Monitors 43
2.38 Footwear 43
2.39 Floors 44
2.40 Personnel Grounding with Garments 44
2.41 Garments 44
2.42 Air Ionization 44
2.43 Seating 45
2.44 Packaging and Shipping 46
2.45 Trays 46
2.46 ESD Identification 46
2.47 ESD Program Auditing 46
2.48 ESD On-Chip Protection 47
2.49 ESD, EOS, EMI, EMC, and Latchup 47
2.50 Manufacturing Electrical Overstress (EOS) 48
2.51 EMI 50
2.52 EMC 50
2.53 Summary and Closing Comments 50
References 50
3 ESD Standards 55
3.1 Factory Flooring 55
3.2 Factory Resistance Measurement of Materials 56
3.3 JEDEC 58
3.4 International Electro-Technical Commission (IEC) 59
3.5 IEEE 59
3.6 Department of Defense (DOD) 59
3.7 Military Standards 59
3.8 SAE 60
3.9 Summary and Closing Comments 60
Questions and Answers 60
References 61
4 ESD Testing 65
4.1 Electrostatic Discharge (ESD) Testing 65
4.2 ESD Models 65
4.3 HBM Test System 69
4.4 HBM Two-pin Test Syst...