This book introduces various kinds of high-precision measurements, including the measurements of time and space, digital activity, border sensors and other physical quantities. Further, it demonstrates how to eliminate the quantitative errors believed to be the main problem in measurements using the border effect. In metrology technology, detection resolution is crucial to improving measurement precision in devices and instruments, and since the resolution is limited, a fuzzy area is usually found during detection. As such the book presents numerous experimental findings showing that the measurement precision can be improved by two or three orders of magnitude compared to traditional methods by achieving stability of resolution and more accurately detecting the border of the fuzzy area.

Prof. Wei Zhou is currently a professor and Ph.D. tutor at Xidian University, Xi'an, China. He received his B.E. degree in Electronic Engineering from Xi'an Jiaotong University, Xi'an, China, in 1970 and his Ph.D. degree in Electronic Instruments from Shizuoka University, Shizuoka, Japan, in 2000. He was an engineer, senior engineer and chief engineer at the Measurement and Test Institute of Shaanxi Province from 1970 to 1988, after which he served at the Information Processing Institute of Xidian University after that. As senior visiting scholar, he has been to Canada, the United States, Japan and Europe many times. He has published more than 200 articles in international journals and conferences. He won 2 National Invention Awards, a Chinese Instrument Invention Award, and more than 20 provincial science and technology progress awards. In 1998 he was named the National Young Expert with Outstanding Contribution.

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